Quick, Simple, and Easy Solutions to Hard Software Problems

Monday, December 10, 2018 -
4:00pm to 5:00pm
CS 1240

Speaker Name: 

Martin Rinard

Speaker Institution: 




Cookies Location: 

CS 1240


I present quick, simple, and easy solutions to hard software
problems such as security vulnerabilities, memory leaks, addressing
errors, infinite loops, program optimization, and automatic
parallelization. Each solution is implemented as an automated program
transformation that takes as input a program that may have one or more
of these problems and produces as output a program without the
problem. A key to these solutions is transcending the traditional
requirement that program transformations preserve the semantics of the
original program. I show how transcending this requirement to focus
on more relevant requirements such as survivability and accuracy can
open up new and productive directions across the entire software
lifecycle. I will also discuss insights that the success of these
techniques highlights and discuss how to leverage these insights in
the design of new programming languages and software systems.

Martin Rinard is a Professor in the MIT Department of Electrical
Engineering and Computer Science and a member of the MIT Computer
Science and Artificial Intelligence Laboratory. His research interests
have included programming languages, computer security, program
analysis, program verification, software engineering, distributed
computing, and high-performance computing. Prominent results have
included the first use of machine learning for automatically generating
correct patches for large production software systems, the first full
functional verification of linked data structures, and pioneering the
identification and exploitation of commuting operations for automatic
parallelization and deterministic parallel execution.

Dr. Rinard holds a PhD in Computer Science from Stanford
University. He is an ACM Fellow and has received many awards including
an Alfred P. Sloan Research Fellowship and Distinguished and Best
Paper awards from a variety of publication venues.